Typically, we see a 4X increase in memory size every 3 years to cater to the needs of new generation devices. Deep submicron devices contain a large number of memories which demands lower area and ...
...doctors in busy surgeries and clinics have little time to test the cognitive function of patients A cross-sectional study has confirmed 'test your memory' (TYM) as a powerful and valid test ...
Background To validate a short cognitive test: the Test Your Memory for Mild Cognitive Impairment (TYM-MCI) in the diagnosis of patients with amnestic mild cognitive impairment or mild Alzheimer’s ...
Objective: To determine the relative importance of MTL and DGM structures in predicting MS performance on memory tests presented in the auditory/verbal and visual/spatial spheres. Methods: Cross ...
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